ANT02 Near‑Field Probes
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The ANT02‑series near‑field probes are cost‑effective near‑field probes mainly used to locate interference sources and identify the root causes of interference. They are primarily applied in EMC pre‑compliance testing. The probes can rapidly detect electromagnetic radiation sources on PCB traces, component surfaces, cables and gaps, helping engineers quickly locate interference sources and implement corresponding rectification measures.
One set of ANT02 near‑field probes includes 5 probes. ANT02‑1, ANT02‑2 and ANT02‑3 are magnetic field probes (optimized for interference detection on closed loops). ANT02‑4 is an electric field probe (suitable for non‑closed‑loop detection such as high‑impedance circuits). ANT02‑5 is a voltage probe (1 kV withstand voltage, for direct probing of device pins).
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